ECM and IOT. How to Predict, Quantify, and Mitigate ECM Failure Potential

Electro-chemical migration (ECM) has become an issue for many assemblers. This webinar will address the current factors influencing ECM-related failure mechanisms and how it affects reliability. Factors that assist in the prediction of ECM will be presented as well as methods to quantify and prevent ECM and other contamination-related failures.
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OTHER ON-DEMAND WEBINARS

IoT, OT, AI, Oh My! The Insecurity of ‘Things’ webinar Q&A with Fred Langston 2019

CI Security

Fred Langston, EVP of Professional Services, recently held an exciting webinar with incredible attendance and reviews on the topic of IoT security. The Q&A was particularly informative—so much so Fred ran out of time to answer all of the questions submitted. We wanted to share that recording here.
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IoT Device Management 2021 market trends and lessons learned

The market for IoT device management has been rapidly evolving over the years, and 2020 has been particularly fast-paced. So what have we learned from 2020? Where is the market headed next? What success factors must enterprises using device management consider? To answer these questions, we will share insights from major projects in healthcare and innovation. Watch this webinar and learn what to look out for in IoT device management projects in 2021.
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Nozomi Networks Labs 1st Half 2022 OT/IoT Security Review: Lessons for Critical Infrastructure

Nozomi Networks Labs latest OT/IoT Research Report takes a deep look the latest attacks on critical infrastructure, along with OT/IoT device vulnerabilities, and cyber threat remediation strategies.
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Mitigating Security Risks When Designing IoT Applications

The ever-growing ecosystem of connected devices inevitably brings additional security risks to enterprises. With this in mind, what should you consider to secure your business systems in an increasingly connected world?
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